Open AccessA Condenser Scanner for Artifact-Free, Large Field of View, Full-Field X-ray Microscopy at Synchrotrons
Author(s) -
J. Rudati,
Jeff Irwin,
A. Tkachuk,
Joy C. Andrews,
P. Pianetta,
Michael Feser,
Ian McNulty,
Catherine Eyberger,
Barry Lai
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625323
Subject(s) - condenser (optics) , optics , scanner , sample (material) , artifact (error) , image quality , microscope , field of view , signal (programming language) , depth of field , noise (video) , computer vision , signal to noise ratio (imaging) , field (mathematics) , artificial intelligence , computer science , physics , image (mathematics) , mathematics , light source , pure mathematics , thermodynamics , programming language
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