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X-ray Grating Interferometry at ESRF: Applications and Recent Technical Developments
Author(s) -
Timm Weitkamp,
Irène Zanette,
G. V. Schulz,
Martin Bech,
Simon Rutishauser,
Stephan Lang,
Tilman Donath,
Arne Tapfer,
Hans Deyhle,
Pascal Bernard,
Jean-Paul Valade,
E. Reznikova,
J. Kenntner,
J. Mohr,
Bert Müller,
Franz Pfeiffer,
Christian Dávid,
J. Baruchel,
Ian McNulty,
Catherine Eyberger,
Barry Lai
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625297
Subject(s) - beamline , interferometry , synchrotron radiation , grating , optics , diffraction grating , synchrotron , physics , computer science , medical physics , beam (structure)

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