Graded index and randomly oriented core-shell silicon nanowires for broadband and wide angle antireflection
Author(s) -
P. Pignalosa,
H. Lee,
Lan Qiao,
Ming Lun Tseng,
YuanQiuQiang Yi
Publication year - 2011
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.3624838
Subject(s) - broadband , materials science , silicon , nanowire , optoelectronics , shell (structure) , core (optical fiber) , layer (electronics) , optics , refractive index , absorption (acoustics) , nanotechnology , composite material , physics
Antireflection with broadband and wide angle properties is important for a wide range of applications on photovoltaic cells and display. The SiOx shell layer provides a natural antireflection from air to the Si core absorption layer. In this work, we have demonstrated the random core-shell silicon nanowires with both broadband (from 400nm to 900nm) and wide angle (from normal incidence to 60º) antireflection characteristics within AM1.5 solar spectrum. The graded index structure from the randomly oriented core-shell (Air/SiOx/Si) nanowires may provide a potential avenue to realize a broadband and wide angle antireflection layer
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