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The effect of surface conductance on lateral gated quantum devices in Si/SiGe heterostructures
Author(s) -
Xi Lin,
Jingshi Hu,
Andrew P. Lai,
Zhenning Zhang,
Kenneth MacLean,
Colin Dillard,
YaHong Xie,
M. A. Kastner
Publication year - 2011
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3610524
Subject(s) - heterojunction , condensed matter physics , quantum dot , spins , quantum point contact , electron , fermi gas , capacitance , electron density , materials science , physics , quantum well , optoelectronics , electrode , quantum mechanics , laser
Quantum dots in Si/SiGe heterostructures are expected to have relatively long electron spin decoherence times, because of the low density of nuclear spins and the weak coupling between nuclear and electron spins. We provide experimental evidence suggesting that electron motion in a conductive layer parallel to the two-dimensional electron gas, possibly resulting from the donors used to dope the Si quantum well, is responsible for the well-known difficulty in achieving well-controlled dots in this system. Charge motion in the conductive layer can cause depletion on large length scales, making electron confinement in the dot impossible, and can give rise to noise that can overwhelm the single-electron charging signal. Results of capacitance versus gate bias measurements to characterize this conductive layer are presented.National Science Foundation (U.S.) ((PHY-0117795)National Science Foundation (U.S.) (DMR-0701386

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