Temperature-time transformation diagram for Pb(Zr,Ti)O3 thin films | Zendy

Ronnie Varghese | Zendy; Matthew R. Williams | Zendy; Shashaank Gupta | Zendy; Shashank Priya | Zendy

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Temperature-time transformation diagram for Pb(Zr,Ti)O3 thin films

Author(s) -

Ronnie Varghese,

Matthew R. Williams,

Shashaank Gupta,

Shashank Priya

Publication year - 2011

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.3606433

Subject(s) - multivariate statistics , annealing (glass) , materials science , thin film , transformation (genetics) , silicon , regression , linear regression , multinomial distribution , regression analysis , mineralogy , metallurgy , mathematics , statistics , chemistry , nanotechnology , biochemistry , gene

In this paper, we describe an analytical model to define the temperature-time- transformation (TTT) diagram of sol-gel deposited Pb(Zr,Ti)O3 thin films on platinized silicon substrates. Texture evolution in film occurred as the pyrolysis and thermal annealing conditions were varied. We demonstrate that the developed model can quantitatively predict the outcome of thermal treatment conditions in terms of texture evolution. Multinomial and multivariate regression techniques were utilized to create the predictor models for TTT data. Further, it was found that multinomial regression can provide better fit as compared to standard regression and multivariate regression. We have generalized this approach so that it can be applied to other thin film deposition techniques and bulk ceramics.

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