Open AccessThe low-temperature infrared optical functions of SrTiO3 determined by reflectance spectroscopy and spectroscopic ellipsometry
Author(s) -
K. Kamarás,
K.-L. Barth,
F. Keilmann,
R. Henn,
M. Reedyk,
C. Thomsen,
M. Cardona,
J. Kircher,
P. L. Richards,
J.-L. Stehlé
Publication year - 1995
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.360364
Subject(s) - ellipsometry , dielectric function , spectroscopy , infrared , reflectivity , analytical chemistry (journal) , materials science , infrared spectroscopy , dielectric , diffuse reflectance infrared fourier transform , range (aeronautics) , superconductivity , complement (music) , chemistry , optics , thin film , condensed matter physics , optoelectronics , physics , nanotechnology , composite material , biochemistry , chromatography , quantum mechanics , photocatalysis , catalysis , organic chemistry , complementation , gene , phenotype
By combining reflectance spectroscopy and spectroscopic ellipsometry, the complex dielectric function of SrTiO3 in the frequency range 40–5000 cm−1 at 20, 100, 200, and 300 K has been determined. Using a factorized description, analytical expressions for the optical quantities were derived, giving excellent agreement with the experimental data. These can be used for two‐layer fits of films on SrTiO3, e.g., of high‐Tc superconductors. The fit parameters complement very well those found at higher temperatures.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom