Secondary-ion-mass spectrometry and near-field studies of Ti:LiNbO3 optical waveguides
Author(s) -
F. Caccavale,
Purushottam Chakraborty,
A. Quaranta,
Ibrahim Mansour,
G. Gianello,
S. Bosso,
R. Corsini,
G. Mussi
Publication year - 1995
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.359713
Subject(s) - secondary ion mass spectrometry , refractive index , diffusion , dopant , waveguide , materials science , ion , anisotropy , refractive index profile , analytical chemistry (journal) , titanium , ion implantation , optics , mass spectrometry , anisotropic diffusion , chemistry , optoelectronics , doping , physics , organic chemistry , chromatography , metallurgy , thermodynamics
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