Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors
Author(s) -
Lei Wang,
Yanwei Ma,
Qingxiao Wang,
Kun Li,
Xixiang Zhang,
Yanpeng Qi,
Zhaoshun Gao,
Xianping Zhang,
Dongliang Wang,
Chao Yao,
Chunlei Wang
Publication year - 2011
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3592580
Subject(s) - crystallite , grain boundary , materials science , coherence length , amorphous solid , nanometre , superconductivity , condensed matter physics , oxide , grain size , crystallography , composite material , microstructure , metallurgy , chemistry , physics
We report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystallineSr0.6K0.4Fe2As2superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (Jc) of polycrystalline samples with respect to that of bicrystal films
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