Coaxial atomic force microscope probes for imaging with dielectrophoresis | Zendy

Keith A. Brown | Zendy; Jesse Berezovsky | Zendy; R. M. Westervelt | Zendy

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Coaxial atomic force microscope probes for imaging with dielectrophoresis

Author(s) -

Keith A. Brown,

Jesse Berezovsky,

R. M. Westervelt

Publication year - 2011

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.3585670

Subject(s) - dielectrophoresis , coaxial , dielectric , dipole , microscope , electric field , materials science , spheres , optics , microscopy , resolution (logic) , atomic force microscopy , image resolution , nanotechnology , optoelectronics , chemistry , physics , organic chemistry , quantum mechanics , astronomy , artificial intelligence , microfluidics , computer science , electrical engineering , engineering

We demonstrate atomic force microscope (AFM) imaging using dielectrophoresis (DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantitative agreement between our model and experiment shows that we are imaging with DEP.

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