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Erratum: “Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation” [Rev. Sci. Instrum. 81, 073102 (2010)]
Author(s) -
Alonso Castro,
Áurea R. Vasconcellos,
Roberto Luzzi
Publication year - 2011
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.3575590
Subject(s) - thermoelastic damping , materials science , irradiation , free electron laser , silicon , laser , x ray , atomic physics , optoelectronics , optics , nuclear physics , physics , thermodynamics , thermal

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