Open AccessErratum: ‘‘Optical study of (AlxGa1−x)0.5ln0.5P/GaAs semiconductor alloys by spectroscopic ellipsometry’’ [J. Appl. Phys. 73, 400 (1993)]
Author(s) -
Huikyo Lee,
M. V. Klein,
D. E. Aspnes,
Chia-Chen Kuo,
M. J. Peanasky,
M. G. Craford
Publication year - 1994
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.357045
Subject(s) - ellipsometry , semiconductor , materials science , condensed matter physics , optoelectronics , optics , physics , nanotechnology , thin film
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