Highly sensitive ion detection using Si single-electron transistors
Author(s) -
Kudo Takashi,
Anri Nakajima
Publication year - 2011
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3569148
Subject(s) - oscillation (cell signaling) , transistor , coulomb blockade , ion , noise (video) , optoelectronics , coulomb , silicon , voltage , materials science , electron , chemistry , atomic physics , analytical chemistry (journal) , physics , computer science , biochemistry , organic chemistry , quantum mechanics , artificial intelligence , chromatography , image (mathematics)
Si single-electron transistors (SETs) were used for highly sensitive ion detection. A multiple-island channel structure was adapted in the SET for room-temperature operation. Clear Coulomb oscillation and diamonds were observed at room temperature. Using the Coulomb oscillation, clear pH responses of drain current (Id)-gate voltage (Vg) characteristics were obtained despite the existence of Id noise. Because Coulomb oscillations have a possibility to increase the slope of Id over Vg near the half-maximum current of the peaks, high resolving power of ion, and/or biomolecule concentration can be expected. A Si-structure will make it possible to integrate the sensors on a single chip.
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