Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys. 74, 291 (1993)] | Zendy

C. Eiche | Zendy; Dirk Maier | Zendy; Jürgen Weese | Zendy; Josef Honerkamp | Zendy; K. W. Benz | Zendy

Open Access

Comment on ‘‘Inverse problem for the nonexponential deep level transient spectroscopy analysis in semiconductor materials with strong disorder: Theoretical and computational aspects’’ [J. Appl. Phys. 74, 291 (1993)]

Author(s) -

C. Eiche,

Dirk Maier,

Jürgen Weese,

Josef Honerkamp,

K. W. Benz

Publication year - 1994

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.356466

Subject(s) - deep level transient spectroscopy , regularization (linguistics) , spectroscopy , inverse , transient (computer programming) , capacitance , inverse problem , semiconductor , transient analysis , semiconductor materials , materials science , condensed matter physics , physics , computational physics , statistical physics , chemistry , mathematics , quantum mechanics , mathematical analysis , computer science , geometry , electrode , artificial intelligence , steady state (chemistry) , operating system , electron

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