Electron and hole drift velocity in chemical vapor deposition diamond
Author(s) -
M. Gabrysch,
Saman Majdi,
Daniel J. Twitchen,
Jan Isberg
Publication year - 2011
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3554721
Subject(s) - drift velocity , electric field , chemical vapor deposition , diamond , electron , saturation velocity , field (mathematics) , materials science , analytical chemistry (journal) , atomic physics , chemistry , optoelectronics , physics , nuclear physics , mathematics , quantum mechanics , chromatography , pure mathematics , composite material
The time-of-flight technique has been used to measure the drift velocities for electrons and holes in high-purity single-crystalline CVD diamond. Measurements were made in the temperature interval 83 ≤ T ≤ 460 K and for electric fields between 90 and 4 × 103 V/cm, applied in the <100> crystallographic direction. The study includes low-field drift mobilities and is performed in the low-injection regime to perturb the applied electric field only minimally
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