Transport properties of epitaxial lift-off films
Author(s) -
R. A. Mena,
S. E. Schacham,
Paul Young,
E. J. Haugland,
Samuel A. Alterovitz
Publication year - 1993
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.354466
Subject(s) - epitaxy , photoconductivity , materials science , substrate (aquarium) , quartz , charge carrier , optoelectronics , hall effect , lift (data mining) , conductivity , electrical resistivity and conductivity , population , shubnikov–de haas effect , condensed matter physics , analytical chemistry (journal) , fermi gas , chemistry , electron , composite material , layer (electronics) , quantum oscillations , physics , geology , oceanography , sociology , computer science , quantum mechanics , data mining , demography , chromatography
Transport properties of epitaxially lifted‐off (ELO) films were characterized using conductivity, Hall, and Shubnikov–de Haas measurements. A 10%–15% increase in the two‐dimensional electron gas concentration was observed in these films as compared with adjacent conventional samples. We believe this result to be caused by a backgating effect produced by a charge buildup at the interface of the ELO film and the quartz substrate. This increase results in a significant decrease in the quantum lifetime in the ELO samples, by 17%–30%, but without a degradation in carrier mobility. Under persistent photoconductivity, only one subband was populated in the conventional structure, while in the ELO films the population of the second subband was clearly visible. However, the increase of the second subband concentration with increasing excitation is substantially smaller than anticipated due to screening of the backgating effect.
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