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Response to ‘‘Comment on ‘Steady-state temperature profile for a thin-film resistor under bias’ ’’ [J. Appl. Phys. 74, 5290 (1993)]
Author(s) -
Roya Sabeti,
E. M. Charlson,
E. J. Charlson
Publication year - 1993
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.354251
Subject(s) - resistor , silicon , materials science , thin film , steady state (chemistry) , silicon dioxide , thermal conductivity , condensed matter physics , thermal , thermodynamics , optoelectronics , electrical engineering , nanotechnology , chemistry , physics , composite material , engineering , voltage

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