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Experimental setup for camera-based measurements of electrically and optically stimulated luminescence of silicon solar cells and wafers
Author(s) -
David Hinken,
Carsten Schinke,
Sandra Herlufsen,
Arne Schmidt,
Karsten Bothe,
Rolf Brendel
Publication year - 2011
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.3541766
Subject(s) - luminescence , materials science , optoelectronics , electroluminescence , silicon , semiconductor , photoluminescence , wafer , optics , physics , nanotechnology , layer (electronics)
We report in detail on the luminescence imaging setup developed within the last years in our laboratory. In this setup, the luminescence emission of silicon solar cells or silicon wafers is analyzed quantitatively. Charge carriers are excited electrically (electroluminescence) using a power supply for carrier injection or optically (photoluminescence) using a laser as illumination source. The luminescence emission arising from the radiative recombination of the stimulated charge carriers is measured spatially resolved using a camera. We give details of the various components including cameras, optical filters for electro- and photo-luminescence, the semiconductor laser and the four-quadrant power supply. We compare a silicon charged-coupled device (CCD) camera with a back-illuminated silicon CCD camera comprising an electron multiplier gain and a complementary metal oxide semiconductor indium gallium arsenide camera. For the detection of the luminescence emission of silicon we analyze the dominant noise sources along with the signal-to-noise ratio of all three cameras at different operation conditions. © 2011 American Institute of Physics

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