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Low temperature epitaxial growth of Ge quantum dot on Si(100)-(2×1) by femtosecond laser excitation
Author(s) -
Ali Er,
Wei Ren,
Hani E. Elsayed-Ali
Publication year - 2011
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3537813
Subject(s) - femtosecond , epitaxy , quantum dot , excitation , materials science , laser , electron diffraction , optoelectronics , reflection high energy electron diffraction , substrate (aquarium) , surface diffusion , electron excitation , pulsed laser deposition , diffraction , thin film , optics , chemistry , nanotechnology , physics , oceanography , organic chemistry , layer (electronics) , quantum mechanics , adsorption , geology
Low temperature epitaxy of Ge quantum dots on Si(100)-(2×1) by femtosecond pulsed laser deposition under femtosecond laser excitation was investigated. Reflection high-energy electron diffraction and atomic force microscopy were used to analyze the growth mode and morphology. Epitaxial growth was achieved at ∼70 °C by using femtosecond laser excitation of the substrate. A purely electronic mechanism of enhanced surface diffusion of the Ge adatoms is proposed.

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