Publisher’s Note: “Application of electron backscatter diffraction to the study on orientation distribution of intermetallic compounds at heterogeneous interfaces (Sn/Ag and Sn/Cu)” [J. Appl. Phys. 108, 103518 (2010)]
Author(s) -
Hua Zou,
Z. F. Zhang
Publication year - 2011
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3532093
Subject(s) - intermetallic , electron backscatter diffraction , materials science , electron diffraction , orientation (vector space) , diffraction , condensed matter physics , distribution (mathematics) , crystallography , metallurgy , chemistry , physics , optics , geometry , microstructure , mathematics , mathematical analysis , alloy
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