Microstructural analysis of interfaces in a ferromagnetic-multiferroic epitaxial heterostructure | Zendy

P. S. Sankara Rama Krishnan | Zendy; Miryam Arredondo | Zendy; Martin Saunders | Zendy; Quentin M. Ramasse | Zendy; V. Nagarajan | Zendy; Paul Munroe | Zendy

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Microstructural analysis of interfaces in a ferromagnetic-multiferroic epitaxial heterostructure

Author(s) -

P. S. Sankara Rama Krishnan,

Miryam Arredondo,

Martin Saunders,

Quentin M. Ramasse,

V. Nagarajan,

Paul Munroe

Publication year - 2011

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.3531992

Subject(s) - materials science , bismuth ferrite , heterojunction , pulsed laser deposition , transmission electron microscopy , epitaxy , multiferroics , scanning transmission electron microscopy , ferromagnetism , optoelectronics , thin film , nanotechnology , ferroelectricity , condensed matter physics , dielectric , physics , layer (electronics)

We report a study on multiferroic bismuth ferrite (BiFeO3, BFO)-ferromagnetic lanthanum strontium manganese oxide (La0.7Sr0.3MnO3, LSMO) epitaxial interfaces by scanning transmission electron microscopy-energy dispersive spectroscopy (STEM-EDS) and energy-filtered transmission electron microscopy (EFTEM). Epitaxial (001) oriented LSMO/BFO heterostructures were fabricated on a (001) strontium titanate (SrTiO3, STO) substrate using pulsed laser deposition (PLD). Different cooling conditions to room temperature (rapid or slow) were used to investigate the effect of fabrication conditions on the structural quality of the interfaces. The combined analysis of bright field transmission electron microscopy imaging, STEM-EDS and EFTEM data reveals that the LSMO-BFO heterostructure interface is free from any defects but the phases are chemically interdiffused over a length scale of ∼4 nm.

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