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Erratum: “A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 81, 093701 (2010)]
Author(s) -
Yoshihiro Hosokawa,
Kei Kobayashi,
Noriaki Oyabu,
Kazumi Matsushige,
Hirofumi Yamada
Publication year - 2011
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.3527911
Subject(s) - atomic force microscopy , resolution (logic) , modulation (music) , microscopy , frequency modulation , non contact atomic force microscopy , materials science , image resolution , optics , physics , atomic physics , conductive atomic force microscopy , nanotechnology , radio frequency , acoustics , computer science , telecommunications , artificial intelligence

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