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Comment on ‘‘Depth profiling of nonuniform optical absorption in thin films: Application to hydrogenated amorphous silicon’’ [J. Appl. Phys. 70, 5025 (1991)]
Author(s) -
G. Grillo,
L. De Angelis
Publication year - 1992
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.352283
Subject(s) - materials science , amorphous solid , silicon , thin film , deflection (physics) , amplitude , optics , amorphous silicon , photothermal spectroscopy , spectral line , molecular physics , photothermal therapy , condensed matter physics , crystalline silicon , optoelectronics , crystallography , nanotechnology , chemistry , physics , astronomy

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