Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy | Zendy

Jeremy Bradshaw | Zendy; X. J. Song | Zendy; J. R. Shealy | Zendy; J. G. Zhu | Zendy; H. O stergaard | Zendy

Open Access

Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy

Author(s) -

Jeremy Bradshaw,

X. J. Song,

J. R. Shealy,

J. G. Zhu,

H. O stergaard

Publication year - 1992

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.352139

Subject(s) - superlattice , transmission electron microscopy , raman spectroscopy , epitaxy , raman scattering , materials science , monolayer , molecular beam epitaxy , diffraction , phonon , condensed matter physics , electron diffraction , scattering , spectroscopy , crystallography , optics , chemistry , optoelectronics , layer (electronics) , nanotechnology , physics , quantum mechanics

We report growth of (InAs)1(AlAs)1 and (InAs)2(AlAs)2 strained layer superlattices by migration enhanced epitaxy. The samples were grown on InP (001) substrates and characterized by Raman spectroscopy, x‐ray diffraction, and transmission electron microscopy. Satellite peaks in the x‐ray data confirm the intended periodicity and indicate the presence of some disorder in the monolayer sample. The energies of the zone folded and quantum confined optic phonons are in reasonable agreement with calculations based on one‐dimensional elastic continuum and linear chain models.

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