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Modeling and optimization of white paint back reflectors for thin-film silicon solar cells
Author(s) -
Benjamin Lipovšek,
Janez Krč,
Olindo Isabella,
Miro Zeman,
Marko Topič
Publication year - 2010
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3512907
Subject(s) - materials science , refractive index , silicon , amorphous silicon , optics , thin film , optoelectronics , reflectivity , dielectric , solar cell , reflector (photography) , amorphous solid , photovoltaic system , crystalline silicon , nanotechnology , chemistry , electrical engineering , physics , engineering , light source , organic chemistry
Diffusive dielectric materials such as white paint have been demonstrated as effective back reflectors in the photovoltaic technology. In this work, a one-dimensional (1D) optical modeling approach for simulation of white paint films is developed and implemented in a 1D optical simulator for thin-film solar cells. The parameters of white paint, such as the paint film thickness, the pigment volume concentration (PVC), and the pigment/binder refractive index ratio (RIR), are examined and optimized to achieve the required optical properties for back reflector application. The simulation trends indicate that white paint back reflectors with sufficient film thickness and higher PVC and RIR values exhibit improved reflectivity characteristics which results in an increased long-wavelength quantum efficiency of thin-film silicon solar cells. The simulation results based on the 1D model agree very well with the experimental data obtained from reflectance measurements of various white paint compositions and quantum efficiency measurements of amorphous silicon solar cells with white paint back reflectors.Electrical Sustainable EnergyElectrical Engineering, Mathematics and Computer Scienc

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