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Impact of stress on the recombination at metal precipitates in silicon
Author(s) -
Paul Gundel,
Martin C. Schubert,
Friedemann D. Heinz,
Wolfram Kwapil,
Wilhelm Warta,
Gema MartínezCriado,
Manfred Reiche,
Eicke R. Weber
Publication year - 2010
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3511749
Subject(s) - recombination , silicon , materials science , metal , stress (linguistics) , chemical physics , metallurgy , chemistry , biochemistry , linguistics , philosophy , gene
Metals corrupt the performance of silicon solar cells severely. In this paper we investigate the recombination activity of metal precipitates and present a strong positive correlation between their recombination activity and the stress around them, independent of the type of metal forming the precipitate. This fundamental observation suggests that stress, together with the size of the precipitate, has a dominant effect on the recombination activity of metallic precipitates. We explain the recombination enhancing effect of stress near precipitates by the strong piezoresistance of silicon

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