Open AccessStructural characterization of Co-Re superlattices
Author(s) -
L.V. Melo,
Isabel Trindade,
M. From,
P. P. Freitas,
N. Teixeira,
M. F. da Silva,
J.C. Soares
Publication year - 1991
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.349731
Subject(s) - superlattice , rutherford backscattering spectrometry , materials science , diffraction , bilayer , characterization (materials science) , x ray crystallography , coherence length , coherence (philosophical gambling strategy) , analytical chemistry (journal) , crystallography , optics , condensed matter physics , chemistry , physics , nanotechnology , optoelectronics , superconductivity , quantum mechanics , biochemistry , chromatography , membrane
Co‐Re superlattices were prepared with nominal periodicities of 65–67 Å and varying bilayer composition. The structural characterization was made by x‐ray diffraction and Rutherford backscattering spectrometry (RBS). First, second, and third order satellites are observed in the x‐ray diffractogram at 2θ values and with intensities close to those predicted by simulation. This confirms the coherence of the superlattice. RBS measurements combined with RUMP simulations give information on interface sharpness and the absolute thicknesses of the Co and Re layers. Discrepancies between the experimental and simulated diffractograms are found for Co thicknesses below 18 Å
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom