High resolution, low hν photoelectron spectroscopy with the use of a microwave excited rare gas lamp and ionic crystal filters
Author(s) -
S. Suga,
A. Sekiyama,
G. Funabashi,
Junichi Yamaguchi,
Masato Kimura,
M. Tsujibayashi,
T. Uyama,
Hiroshi Sugiyama,
Y Tomida,
Go Kuwahara,
Satoshi KITAYAMA,
K. Fukushima,
Kenta Kimura,
Takeaki Yokoi,
Kazuhiro Murakami,
H. Fujiwara,
Y. Saitoh,
Łukasz Pluciński,
C. M. Schneider
Publication year - 2010
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.3488367
Subject(s) - x ray photoelectron spectroscopy , materials science , excited state , sapphire , microwave , spectroscopy , crystal (programming language) , atomic physics , ionic bonding , analytical chemistry (journal) , optoelectronics , optics , nuclear magnetic resonance , ion , chemistry , laser , physics , computer science , programming language , organic chemistry , quantum mechanics , chromatography
The need for not only bulk sensitive but also extremely high resolution photoelectron spectroscopy for studying detailed electronic structures of strongly correlated electron systems is growing rapidly. Moreover, easy access to such a capability in one’s own laboratory is desirable. Demonstrated here is the performance of a microwave excited rare gas (Xe, Kr, and Ar) lamp combined with ionic crystal filters (sapphire,CaF2, and LiF), which can supply three strong lines near the photon energy of hnyu hν=8.4, 10.0, and 11.6 eV, with the hν resolution of better than 600 μeV for photoelectron spectroscopy. Its performance is demonstrated on some materials by means of both angle-integrated and angle-resolved measurements
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