Open AccessSize-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering
Author(s) -
S. J. S. Lister,
Thomas Thomson,
Joachim Kohlbrecher,
K. Takano,
V. Venkataramana,
S. J. Ray,
M. P. Wismayer,
M. A. de Vries,
Hoa Do,
Y. Ikeda,
Stephen Lee
Publication year - 2010
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3486680
Subject(s) - condensed matter physics , materials science , scattering , grain size , neutron scattering , perpendicular , magnetization , small angle neutron scattering , anisotropy , magnetic anisotropy , small angle scattering , perpendicular recording , recording media , magnetic structure , magnetic field , optics , physics , composite material , multimedia , geometry , mathematics , computer science , quantum mechanics
Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt–SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (<10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter.
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