Open AccessDifferential Phase-Contrast Scanning X-Ray Microscope For Observation Of Low-Z element Specimen
Author(s) -
Akihisa Takeuchi,
Kentaro Uesugi,
Yoshio Suzuki,
Karen K. W. Siu
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3478196
Subject(s) - optics , microscope , materials science , detector , phase (matter) , absorption (acoustics) , microscopy , differential interference contrast microscopy , contrast (vision) , sensitivity (control systems) , pixel , image sensor , charge coupled device , image resolution , optical microscope , physics , scanning electron microscope , quantum mechanics , electronic engineering , engineering
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