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X-ray phase-contrast imaging with an Inverse Compton Scattering source
Author(s) -
Marco Endrizzi,
M. Carpinelli,
P. Delogu,
P. Oliva,
Bruno Golosio,
Timur E. Gureyev,
U. Bottigli,
A. Stefanini,
Karen K. W. Siu
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3478194
Subject(s) - optics , phase contrast imaging , compton scattering , scattering , picosecond , phase retrieval , inverse scattering problem , phase (matter) , physics , inverse , contrast (vision) , inverse problem , materials science , phase contrast microscopy , laser , geometry , mathematics , fourier transform , quantum mechanics , mathematical analysis
Single‐shot in‐line phase‐contrast imaging with the Inverse Compton Scattering X‐ray source available at ATF (Accelerator Test Facility) at Brookhaven National Laboratory is experimentally demonstrated. Phase‐contrast images of polymer wires are obtained with a single X‐ray pulse whose time length is about 1 picosecond. The edge‐enhancement effect is clearly visible in the images and simulations show a quantitative agreement with experimental data. A phase‐retrieval step in the image processing leads to a accurate estimation of the projected thickness of our samples. Finally, a single‐shot image of a wasp is presented as an example of a biological sample.

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