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Bystander Effects During Synchrotron Imaging Procedures?
Author(s) -
Elisabeth Schültke,
Brian Bewer,
Tomasz W. Wysokiński,
Dean Chapman,
Guido Nikkhah,
Karen K. W. Siu
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3478188
Subject(s) - irradiation , bystander effect , beamline , synchrotron , synchrotron radiation , materials science , nuclear medicine , in vivo , biomedical engineering , optics , medicine , beam (structure) , biology , physics , immunology , nuclear physics , microbiology and biotechnology

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