Open AccessThickness measurement of thin films by x-ray absorption
Author(s) -
J. Chaudhuri,
Sejal Shah
Publication year - 1991
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.347691
Subject(s) - diffraction , thin film , amorphous solid , materials science , crystallite , x ray crystallography , optics , absorption (acoustics) , substrate (aquarium) , crystal (programming language) , single crystal , x ray , intensity (physics) , crystallography , composite material , chemistry , physics , nanotechnology , programming language , oceanography , geology , computer science , metallurgy
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