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Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [Appl. Phys. Lett. 94, 162903 (2009)]
Author(s) -
A.H.G. Vlooswijk,
Gustau Catalán,
Beatriz Noheda
Publication year - 2010
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3467005
Subject(s) - piezoresponse force microscopy , nanometre , ferroelectricity , materials science , microscopy , condensed matter physics , nanotechnology , resolution (logic) , atomic force microscopy , optoelectronics , optics , physics , composite material , computer science , artificial intelligence , dielectric
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