Electrical and optical properties of SnEuTe and SnSrTe films
Author(s) -
Akihiro Ishida,
Takuro Tsuchiya,
Tomohiro Yamada,
Daoshe Cao,
S. Takaoka,
Mohamed Rahim,
F. Felder,
H. Zogg
Publication year - 2010
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3446819
Subject(s) - spectral line , epitaxy , ternary alloy , materials science , optical spectra , ternary operation , electronic band structure , atmospheric temperature range , condensed matter physics , optoelectronics , alloy , analytical chemistry (journal) , chemistry , physics , thermodynamics , nanotechnology , metallurgy , layer (electronics) , astronomy , computer science , programming language , chromatography
The SnTe, Sn1−xEuxTe and Sn1−xSrxTe (x<0.06) films were prepared by hot wall epitaxy. The ternary alloy films prepared in cation rich condition had hole concentration around 1×1019 cm−3 with high mobility exceeding 2000 cm2/V s at room temperature. Optical transmission spectra were also measured in the temperature range from 100 to 400 K and compared with theoretical calculations. Optical transmission spectra of the SnTe were simulated successfully assuming bumped band edge structures. A band inversion model was proposed for the Sn1−xEuxTe and Sn1−xSrxTe systems, and the optical transmission spectra were also simulated successfully assuming the band inversion model.
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