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On the phase formation of sputtered hafnium oxide and oxynitride films
Author(s) -
K. Sarakinos,
Denis Mušić,
Stanislav Mráz,
Moritz to Baben,
K. Jiang,
F. Nahif,
A. Braun,
C. Zilkens,
Stéphanos Konstantinidis,
Fabian Renaux,
Damien Cossement,
Frans Munnik,
Jochen M. Schneider
Publication year - 2010
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3437646
Subject(s) - hafnium , sputtering , materials science , high power impulse magnetron sputtering , sputter deposition , tetragonal crystal system , oxide , phase (matter) , analytical chemistry (journal) , crystal structure , thin film , zirconium , crystallography , chemistry , nanotechnology , metallurgy , organic chemistry , chromatography
Hafnium oxynitride films are deposited from a Hf target employing direct current magnetron sputtering in an Ar-O(2)-N(2) atmosphere. It is shown that the presence of N(2) allows for the stabilizati ...

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