Suppression of concentration quenching of Er-related luminescence in Er-doped GaN
Author(s) -
Shaoqiang Chen,
Benjamin Dierre,
Woong Lee,
Takashi Sekiguchi,
Shigeo Tomita,
Hiroshi Kudo,
Katsuhiro Akimoto
Publication year - 2010
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3421535
Subject(s) - cathodoluminescence , luminescence , photoluminescence , erbium , doping , materials science , quenching (fluorescence) , analytical chemistry (journal) , excitation , epitaxy , molecular beam epitaxy , optoelectronics , chemistry , fluorescence , nanotechnology , optics , physics , electrical engineering , chromatography , layer (electronics) , engineering
Erbium-doped GaN with different doping concentrations were grown by ammonia-source molecular beam epitaxy. The intra-4f-shell transitions related green luminescence were observed by both photoluminescence (PL) and cathodoluminescence (CL) measurements. It was found that concentration quenching of Er-related luminescence was observed in PL measurements while not in CL measurements. The different excitation and relaxation processes are suggested as the cause of the concentration quenching characteristics between PL and CL. The strong Er-related CL intensity in highly doped GaN demonstrates that high energy excitation is a promising approach to suppress the concentration quenching in Er-doped GaN
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