Open AccessErratum: ‘‘Theoretical and experimental determination of deep trap profiles in semiconductors’’ [J. Appl. Phys. 6 1, 1063 (1987)]
Author(s) -
Jian Hui Zhao,
Jyh-Chwen Lee,
Z.-Q. Fang,
T. E. Schlesinger,
A. G. Milnes
Publication year - 1987
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.338980
Subject(s) - trap (plumbing) , semiconductor , physics , condensed matter physics , quantum mechanics , meteorology
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