Optical properties of quasi-tetragonal BiFeO3 thin films
Author(s) -
P. Chen,
Nikolas J. Podraza,
Xiaoshan Xu,
Alexander Melville,
Eftihia Vlahos,
Venkatraman Gopalan,
R. Ramesh,
Darrell G. Schlom,
J. L. Musfeldt
Publication year - 2010
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3364133
Subject(s) - tetragonal crystal system , materials science , band gap , thin film , absorption (acoustics) , epitaxy , absorption spectroscopy , ellipsometry , spectroscopy , infrared , condensed matter physics , ultraviolet , optoelectronics , optics , chemistry , crystallography , crystal structure , physics , nanotechnology , layer (electronics) , quantum mechanics , composite material
Optical transmission spectroscopy and spectroscopic ellipsometry were used to extract the optical properties of an epitaxially grown quasi-tetragonal BiFeO3 thin film in the near infrared to near ultraviolet range. The absorption spectrum is overall blue shifted compared with that of rhombohedral BiFeO3, with an absorption onset near 2.25 eV, a direct 3.1 eV band gap, and charge transfer excitations that are ∼0.4 eV higher than those of the rhombohedral counterpart. We interpret these results in terms of structural strain and local symmetry breaking.
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