Open AccessErratum: Estimation of light‐reflection‐layer thickness by optical second‐harmonic generation and Raman scattering from semiconductor superlattices [J. Appl. Phys. 57, 1500 (1985)]
Author(s) -
K. Kubota
Publication year - 1985
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.336316
Subject(s) - raman scattering , superlattice , second harmonic generation , reflection (computer programming) , optics , raman spectroscopy , semiconductor , layer (electronics) , nonlinear optics , materials science , physics , condensed matter physics , optoelectronics , laser , nanotechnology , computer science , programming language
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