SYNTHETIC DEFECTS FOR VIBROTHERMOGRAPHY | Zendy

Jeremy Renshaw | Zendy; Stephen D. Holland | Zendy; R. B. Thompson | Zendy; David J. Eisenmann | Zendy; Donald O. Thompson | Zendy; Dale E. Chimenti | Zendy

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SYNTHETIC DEFECTS FOR VIBROTHERMOGRAPHY

Author(s) -

Jeremy Renshaw,

Stephen D. Holland,

R. B. Thompson,

David J. Eisenmann,

Donald O. Thompson,

Dale E. Chimenti

Publication year - 2010

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.3362435

Subject(s) - reliability (semiconductor) , nondestructive testing , stator , computer science , reliability engineering , materials science , mechanical engineering , engineering , medicine , power (physics) , physics , quantum mechanics , radiology

Synthetic defects are an important tool used for characterizing the performance of nondestructive evaluation techniques. Viscous material‐filled synthetic defects were developed for use in vibrothermography (also known as sonic IR) as a tool to improve inspection accuracy and reliability. This paper describes how the heat‐generation response of these VMF synthetic defects is similar to the response of real defects. It also shows how VMF defects can be applied to improve inspection accuracy for complex industrial parts and presents a study of their application in an aircraft engine stator vane.

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