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Ultrasmall particle detection using a submicron Hall sensor
Author(s) -
Olga Kazakova,
Vishal Panchal,
John Gallop,
P. See,
David Cox,
M. Spasova,
L. F. Cohen
Publication year - 2010
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3360584
Subject(s) - materials science , hall effect sensor , optoelectronics , hall effect , metrology , bar (unit) , detector , sensitivity (control systems) , nanoparticle , magnetic field , nanotechnology , magnet , optics , physics , electronic engineering , quantum mechanics , meteorology , engineering
We demonstrate detection of a single FePt nanoparticle (diameter 150 nm, moment ∼107 μB) using an ultrasensitive InSb Hall sensor with the bar lateral width of 600 nm. The white noise of a typical nanodevice, SV1/2≈28 nV/√Hz, is limited only by two-terminal resistance of the voltage leads which results in a minimum field sensitivity of the device Bmin=0.87 μT/√Hz. To detect a single FePt bead, we employed a phase-sensitive method based on measuring the ac susceptibility change in a bead when exposed to a switched dc magnetic field. Such nano-Hall devices, enabling detection of potentially even smaller moments, are of considerable significance both for nanomagnetic metrology and high sensitivity biological and environmental detectors.

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