Interface effects in ZnO metal-insulator-semiconductor and metal-semiconductor structures
Author(s) -
Heiko Frenzel,
Holger von Wenckstern,
Alexander Lajn,
M. Brandt,
G. Biehne,
H. Hochmuth,
Michael Lorenz,
Marius Grundmann,
Marília Caldas,
Nélson Studart
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3295509
Subject(s) - misfet , mesfet , materials science , optoelectronics , high electron mobility transistor , semiconductor , field effect transistor , transistor , substrate (aquarium) , sapphire , electrical engineering , laser , optics , oceanography , physics , voltage , geology , engineering
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