Open AccessInfluence of Quantum-Dots Density on Average In-Plane Strain of Optoelectronic Devices by X-Ray Renninger Scanning
Author(s) -
Raul O. Freitas,
Sérgio L. Morelhão,
A. A. Quivy,
Marília Caldas,
Nélson Studart
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3295448
Subject(s) - materials science , quantum dot , optoelectronics , x ray , strain (injury) , scanning electron microscope , optics , physics , composite material , medicine
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom