Local Electrical Analysis of a Single Semiconductor Nanowire by Kelvin Probe Force Microscopy | Zendy

Sasa Vinaji | Zendy; André Lochthofen | Zendy; W. Mertin | Zendy; I. Regolin | Zendy; Christoph Gutsche | Zendy; K. Blekker | Zendy; W. Prost | Zendy; Franz J. Tegude | Zendy; G. Bacher | Zendy; Marília Caldas | Zendy; Nélson Studart | Zendy

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Local Electrical Analysis of a Single Semiconductor Nanowire by Kelvin Probe Force Microscopy

Author(s) -

Sasa Vinaji,

André Lochthofen,

W. Mertin,

I. Regolin,

Christoph Gutsche,

K. Blekker,

W. Prost,

Franz J. Tegude,

G. Bacher,

Marília Caldas,

Nélson Studart

Publication year - 2010

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.3295435

Subject(s) - kelvin probe force microscope , nanowire , materials science , microscopy , semiconductor , characterization (materials science) , voltage drop , doping , atomic force microscopy , conductive atomic force microscopy , drop (telecommunication) , atomic force acoustic microscopy , optoelectronics , voltage , volta potential , electrical resistance and conductance , nanotechnology , gallium arsenide , magnetic force microscope , optics , composite material , electrical engineering , physics , engineering , magnetization , quantum mechanics , magnetic field

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