Influence Of Sb Induced Surface Faceting On Structural Properties Of Relaxed Ge Films On Si(001)
Author(s) -
Tobias Wietler,
Eddy P. Rugeramigabo,
E. Bugiel,
K.R. Hofmann,
Marília Caldas,
Nélson Studart
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3295345
Subject(s) - faceting , materials science , transmission electron microscopy , diffraction , pulmonary surfactant , electron diffraction , germanium , crystallography , nanotechnology , silicon , optoelectronics , chemical engineering , optics , chemistry , physics , engineering
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