Open AccessAg related defect state in ZnO thin films
Author(s) -
Holger von Wenckstern,
Alexander Lajn,
Andreas Läufer,
Bruno Meyer,
H. Hochmuth,
Michael Lorenz,
Marius Grundmann,
Marília Caldas,
Nélson Studart
Publication year - 2010
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3295327
Subject(s) - materials science , sapphire , thin film , spectroscopy , pulsed laser deposition , oxide , diode , analytical chemistry (journal) , capacitance , optoelectronics , laser , optics , nanotechnology , metallurgy , chemistry , electrode , physics , chromatography , quantum mechanics
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