Open AccessReply to ’’Comment on ’A unified explanation for secondary ion yields’ and ’Mechanism of the SIMS matrix effect’’’
Author(s) -
Peter Williams,
V. R. Deline,
C. A. Evans,
W. Katz
Publication year - 1981
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.328452
Subject(s) - caesium , ionization , ion , scaling , chemistry , fluorine , atomic physics , thermal ionization , secondary ion mass spectrometry , matrix (chemical analysis) , oxygen , chemical physics , inorganic chemistry , electron ionization , physics , geometry , mathematics , organic chemistry , chromatography
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