Open AccessErratum: Computer simulation of SEM electron beam induced current images of dislocations and stacking faults [J. Appl. Phys. 51, 1624 (1980)]
Author(s) -
C. Donolato,
H. Klann
Publication year - 1980
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.328412
Subject(s) - stacking , cathode ray , electron , condensed matter physics , materials science , current (fluid) , computational physics , physics , nuclear magnetic resonance , nuclear physics , thermodynamics
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