Open AccessA diffraction-limited scanning system providing broad spectral range for laser scanning microscopy
Author(s) -
Jiun-Yann Yu,
Chien-Sheng Liao,
Zong-Yan Zhuo,
Chen-Han Huang,
HsiangChen Chui,
ShiWei Chu
Publication year - 2009
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.3254021
Subject(s) - optics , materials science , lens (geology) , strehl ratio , coma (optics) , laser scanning , laser , scanning electron microscope , diffraction , chromatic aberration , physics , chromatic scale
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