Spectrally narrowed edge emission from leaky waveguide modes in organic light-emitting diodes
Author(s) -
Zhengqing Gan,
Yun Tian,
D. W. Lynch,
Ji-Hun Kang,
QHan Park,
J. Shinar
Publication year - 2009
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3253582
Subject(s) - oled , materials science , optoelectronics , electroluminescence , substrate (aquarium) , emission spectrum , optics , indium tin oxide , biasing , diode , spectral line , layer (electronics) , physics , voltage , nanotechnology , oceanography , quantum mechanics , geology , astronomy
A dramatic spectral line narrowing of the edge emission at room temperature from tris(quinolinolate) Al (Alq3), N,N′-diphenyl-N,N′-bis(1-naphthylphenyl)-1,1′-biphenyl-4,4′-diamine (NPD), 4,4′-bis(2,2′-diphenyl-vinyl)-,1′-biphenyl (DPVBi), and some guest-host small molecular organic light-emitting diodes (OLEDs), fabricated on indium tin oxide (ITO)-coated glass, is described. In all but the DPVBi OLEDs, the narrowed emission band emerges above a threshold thickness of the emitting layer, and narrows down to a full width at half maximum of only 5–10 nm. The results demonstrate that this narrowed emission is due to irregular waveguide modes that leak from the ITO to the glass substrate at a grazing angle. While measurements of variable stripe length l devices exhibit an apparent weak optical gain 0≤g≤1.86 cm−1, there is no observable threshold current or bias associated with this spectral narrowing. In addition, in the phosphorescent guest-host OLEDs, there is no decrease in the emission decay time of the n...
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